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This paper is an overview of the activities performed in the
framework of the European IST project EuNICE-Test (European Network
for Initial and Continuing Education in VLSI/SOC Testing) using
remote automatic test equipment (ATE) ), addressing the shortage of
skills in the microelectronics industry in the field of electronic
testing. The project was based on the experience of the common test
resource centre (CRTC) for French universities. In the framework of
the EuNICE-Test project, the existing network expanded to 4 new
academic centres: Universitat Politecnica de Catalunya, Spain,
Politecnico di Torino, Italy, University of Stuttgart, Germany and
Jozef Stefan Institute Ljubljana, Slovenia. Assessments of the
results achieved are presented as well as course topics and possible
future extensions.
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